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Oxygen diffusivity in silicon derived from dynamical X-ray diffraction
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10.1063/1.4792747
/content/aip/journal/jap/113/7/10.1063/1.4792747
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/7/10.1063/1.4792747
/content/aip/journal/jap/113/7/10.1063/1.4792747
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/content/aip/journal/jap/113/7/10.1063/1.4792747
2013-02-20
2014-12-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Oxygen diffusivity in silicon derived from dynamical X-ray diffraction
http://aip.metastore.ingenta.com/content/aip/journal/jap/113/7/10.1063/1.4792747
10.1063/1.4792747
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