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An electronic structure reinterpretation of the organic semiconductor/electrode interface based on argon gas cluster ion beam sputtering investigations
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10.1063/1.4812582
/content/aip/journal/jap/114/1/10.1063/1.4812582
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/1/10.1063/1.4812582
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Figures

Image of FIG. 1.
FIG. 1.

Experimental schematic of bottom-up and top-down UPS analyses combined with pentacene deposition and Ar GCIB sputtering processes.

Image of FIG. 2.
FIG. 2.

5 × 5 m AFM images of (a) as-deposited pentacene layers grown on PEDOT:PSS films and those obtained after (b) 1 min, (c) 4 min, and (d) 20 min of of Ar GCIB sputtering. (e) Their XRD patterns. Ar GCIB sputtering was carried out with a 1 cm × 1 cm raster size for different intervals.

Image of FIG. 3.
FIG. 3.

XPS core level spectra (C 1, S 2, and O 1) and atomic concentration depth profiles of the pentacene (∼10 nm)/PEDOT:PSS structures obtained using continual (a,c) Ar ion and (b,d) Ar GCIB sputtering processes.

Image of FIG. 4.
FIG. 4.

(a,c) Secondary cut-off regions and (b,d) Fermi edge regions of the UPS spectra obtained from stepwise UPS measurements (bottom-up method) during pentacene layer deposition on the (a,b) Au and (c,d) PEDOT:PSS films.

Image of FIG. 5.
FIG. 5.

(a) Distorted UPS spectra of the pentacene/PEDOT:PSS structure obtained using Ar ion bombardment and (b) UPS spectra of the undamaged pentacene/Au structure obtained using the Ar GCIB sputtering process under a high acceleration voltage of 10 kV. (c) Full and (b) low binding energy (under 12 eV) areas of the UPS spectra of the pentacene/PEDOT:PSS structure obtained using the Ar GCIB sputtering process at a low acceleration voltage (5 kV).

Image of FIG. 6.
FIG. 6.

(a,c) Secondary cutoff and (b,d) Fermi edge regions of the UPS spectra of he (a,b) pentacene/Au and (c,d) pentacene/PEDOT:PSS structures obtained from UPS measurements (top-down method) combined with Ar GCIB sputtering.

Image of FIG. 7.
FIG. 7.

Band diagrams of energy-level alignments at the (a,b) pentacene (∼15 nm)/Au and (c,d) pentacene (∼15 nm)/PEDOT:PSS interfaces determined using the (a,c) top-down and (b,d) bottom-up methods.

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/content/aip/journal/jap/114/1/10.1063/1.4812582
2013-07-01
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: An electronic structure reinterpretation of the organic semiconductor/electrode interface based on argon gas cluster ion beam sputtering investigations
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/1/10.1063/1.4812582
10.1063/1.4812582
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