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Study of dielectric loss mechanisms in Bi1.5MgNb1.5O7 thin film varactors
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10.1063/1.4812586
/content/aip/journal/jap/114/1/10.1063/1.4812586
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/1/10.1063/1.4812586
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Frequency dependence (a) of capacitance (b) and loss tangent.

Image of FIG. 2.
FIG. 2.

Loss tangent vs. permittivity and angular frequency (εω).

Image of FIG. 3.
FIG. 3.

Loss tangent of BMN film vs capacitance at 1 MHz. The data are taken from capacitance-voltage and loss tangent-voltage measurements.

Image of FIG. 4.
FIG. 4.

Loss tangent as a function of the cube root of angular frequency (ω): (a) of the BMN film annealed with O/(O+Ar) mixing ratio of 15% for 0.5 h; (b) the BMN film annealed with O/(O+Ar) mixing ratio of 15% for 1 h; (c) the BMN film annealed with oxygen for 1 h. All the BMN films are annealed at 700 °C, 1 Pa.

Image of FIG. 5.
FIG. 5.

Loss tangent as a function of the cube root of angular frequency (ω).

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/content/aip/journal/jap/114/1/10.1063/1.4812586
2013-07-01
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Study of dielectric loss mechanisms in Bi1.5MgNb1.5O7 thin film varactors
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/1/10.1063/1.4812586
10.1063/1.4812586
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