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Nanoscale characterization of FeNi alloys processed by high-pressure torsion using photoelectron emission microscope
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10.1063/1.4824372
/content/aip/journal/jap/114/14/10.1063/1.4824372
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/14/10.1063/1.4824372
/content/aip/journal/jap/114/14/10.1063/1.4824372
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/content/aip/journal/jap/114/14/10.1063/1.4824372
2013-10-10
2014-12-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoscale characterization of FeNi alloys processed by high-pressure torsion using photoelectron emission microscope
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/14/10.1063/1.4824372
10.1063/1.4824372
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