Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
/content/aip/journal/jap/114/17/10.1063/1.4828872
1.
1. A. Sugimoto, H. Ochi, S. Fujimura, A. Yoshida, T. Miyadera, and M. Tsuchida, IEEE J. Sel. Top. Quantum Electron. 10, 107 (2004).
http://dx.doi.org/10.1109/JSTQE.2004.824112
2.
2. M. Hermenau, S. Schubert, H. Klumbies, J. Fahlteich, L. Müller-Meskamp, K. Leo, and M. Riede, Sol. Energy Mater. Sol. Cells 97, 102 (2012).
http://dx.doi.org/10.1016/j.solmat.2011.09.026
3.
3. P. E. Burrows, V. Bulovic, S. R. Forrest, L. S. Sapochak, D. M. McCarty, and M. E. Thompson, Appl. Phys. Lett. 65, 2922 (1994).
http://dx.doi.org/10.1063/1.112532
4.
4. M. S. Weaver, L. A. Michalski, K. Rajan, M. A. Rothman, J. A. Silvernail, J. J. Brown, P. E. Burrows, G. L. Graff, M. E. Gross, P. M. Martin, M. Hall, E. Mast, C. Bonham, W. Bennett, and M. Zumhof, Appl. Phys. Lett. 81, 2929 (2002).
http://dx.doi.org/10.1063/1.1514831
5.
5. M. Hanika, H.-C. Langowski, U. Moosheimer, and W. Peukert, Chem. Eng. Technol. 26, 605 (2003).
http://dx.doi.org/10.1002/ceat.200390093
6.
6. T. N. Chen, D. S. Wuu, C. C. Wu, C. C. Chiang, Y. P. Chen, and R. H. Horng, Electrochem. Soc. 153(10), F244 (2006).
http://dx.doi.org/10.1149/1.2335592
7.
7. P. F. Carcia, R. S. Mclean, M. D. Groner, A. A. Dameron, and S. M. George, J. Appl. Phys. 106, 023533 (2009).
http://dx.doi.org/10.1063/1.3159639
8.
8. G. L. Graff, R. E. Williford, and P. E. Burrows, J. Appl. Phys. 96, 1840 (2004).
http://dx.doi.org/10.1063/1.1768610
9.
9. J. D. Hoffman and S. Franke, Numerical Methods for Engineers and Scientists, 2nd ed. (Marcel Dekker, Inc. New York, 2001), p. 536.
10.
10. H. Norenberg, “ Method and apparatus for measuring the rate of permeation,” U.S. patent 7,685,865 (2010).
11.
11. B. J. Todd, J. Appl. Phys. 26, 1238 (1955).
http://dx.doi.org/10.1063/1.1721882
12.
12. Y. Tuzi, J. Phys. Soc. Jpn. 17, 218 (1962).
http://dx.doi.org/10.1143/JPSJ.17.218
13.
13. K. M. Davis and M. Tomozawa, J. Non-Cryst. Solids 185, 203 (1995).
http://dx.doi.org/10.1016/0022-3093(95)00015-1
14.
14. R. Muller, M. Gaber, and P. Gottschling, “ Volatile concentration and diffusivity determined by vacuum hot extraction,” in Proceedings of XX ICG in Kyoto, Kyoto, Japan, 27 September–1 October, edited by H. Taguchi (Ceramic Society of Japan, 2004), O-07-044, pp. 16.
15.
15. A. Zouine, O. Dersch, G. Walter, and F. Rauch, Phys. Chem. Glasses: Eur. J. Glass Sci. Technol. B48(2), 85 (2007).
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/17/10.1063/1.4828872
Loading
/content/aip/journal/jap/114/17/10.1063/1.4828872
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/jap/114/17/10.1063/1.4828872
2013-11-01
2016-12-09

Abstract

We report estimation of the effective diffusion coefficient of moisture through a barrier coating to develop an encapsulation technology for the thin-film electronics industry. This investigation targeted a silicon oxide (SiO) film that was deposited on a plastic substrate by a large-process-area web coater. Using the finite difference method based on diffusion theory, our estimation of the effective diffusion coefficient of a SiO film corresponded to that of bulk glass that was previously reported. This result suggested that the low diffusivities of barrier films can be obtained on a mass-production level in the factory. In this investigation, experimental observations and mathematical confirmation revealed the limit of the water vapor transmission rate on the single barrier coating.

Loading

Full text loading...

/deliver/fulltext/aip/journal/jap/114/17/1.4828872.html;jsessionid=U1LEYNifhc3IdCui0VgRMORE.x-aip-live-03?itemId=/content/aip/journal/jap/114/17/10.1063/1.4828872&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/jap
true
true

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=jap.aip.org/114/17/10.1063/1.4828872&pageURL=http://scitation.aip.org/content/aip/journal/jap/114/17/10.1063/1.4828872'
Right1,Right2,Right3,