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Topography, complex refractive index, and conductivity of graphene layers measured by correlation of optical interference contrast, atomic force, and back scattered electron microscopy
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10.1063/1.4831937
/content/aip/journal/jap/114/18/10.1063/1.4831937
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/18/10.1063/1.4831937
/content/aip/journal/jap/114/18/10.1063/1.4831937
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/content/aip/journal/jap/114/18/10.1063/1.4831937
2013-11-14
2014-09-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Topography, complex refractive index, and conductivity of graphene layers measured by correlation of optical interference contrast, atomic force, and back scattered electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/18/10.1063/1.4831937
10.1063/1.4831937
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