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Strong magnetization damping induced by Ag nanostructures in Ag/NiFe/Ag trilayers
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Image of FIG. 1.
FIG. 1.

SEM images of Ag deposited on top of Si. Figures (a) and (b), which correspond to nominal thicknesses of 3 nm and 6 nm, respectively, show that before the Ag films become continuous layers, there is a formation of nanostructures that act as molds for the deposited Py film. Figures (c) and (d) show that for  > 10 nm, the Ag films are continuous layers and there is no formation of defects on the surface of the Py layer.

Image of FIG. 2.
FIG. 2.

In-plane dependence of the FMR field (solid squares) and linewidth (solid circles) for a single film of Py(10 nm) on Si(001). The solid lines are fits to the data. The in-plane dependence of the Δ linewidth is explained as a superposition of the intrinsic Gilbert mechanism (red dashed line) plus an extrinsic two-magnon scattering mechanism (black dashed line).

Image of FIG. 3.
FIG. 3.

In-plane dependence of Δ for samples Ag(3 nm)/Py(10 nm)/Ag(3 nm) (a) and Ag(6 nm)/Py(10 nm)/Ag(6 nm) (b). The solid blue line is the best fit to the data that include the contribution of the intrinsic Gilbert damping (red dashed lines) and extrinsic contributions: two-magnons (black dashed lines) and fluctuation of the magnetization (green dashed lines).

Image of FIG. 4.
FIG. 4.

Dependence of the average values of the FMR linewidth as a function of the Ag layer thickness for the series of samples Si(001)/Ag(t)/Py(10 nm)/Ag(t), given by the solid blue circles. Error bars are extracted from the average values of 18 FMR sweeps, where the sample is rotated by 20° for each value. The inset shows the in-plane dependence of Δ for two series of samples in which the Ag layer is only deposited as buffer layer (black solid circles) or only as cover layers (red solid circles).


Generic image for table
Table I.

Parameters extracted from numerical fits to the data.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Strong magnetization damping induced by Ag nanostructures in Ag/NiFe/Ag trilayers