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Low threshold for optical damage in AlGaN epilayers and heterostructures
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10.1063/1.4834520
/content/aip/journal/jap/114/20/10.1063/1.4834520
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/20/10.1063/1.4834520
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Time-integrated PL spectra of AlGaN epilayer measured at reference excitation (0.2 mJ/cm2), before and after exposure to 3000 shots at different energy densities (indicated).

Image of FIG. 2.
FIG. 2.

Normalized temporally and spectrally integrated PL intensity measured at reference excitation (0.2 mJ/cm2), as a function of pulse energy density of the preceding exposure (3000 shots) for the four samples under study.

Image of FIG. 3.
FIG. 3.

Time evolution of spectrally integrated PL intensity from AlGaN epilayer (a), and AlGaN/AlGaN MQWs (b), measured at reference excitation (0.2 mJ/cm2), from virgin surface and after exposure to 3000 shots of laser irradiation at two different pulse energy densities (indicated). Bi-exponential fits are also shown.

Image of FIG. 4.
FIG. 4.

Normalized temporally and spectrally integrated PL intensity measured at reference excitation (0.2 mJ/cm2), as a function of duration of exposure to laser irradiation at two excitation pulse energy densities (indicated) for AlGaN/AlGaN MQWs.

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/content/aip/journal/jap/114/20/10.1063/1.4834520
2013-11-26
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low threshold for optical damage in AlGaN epilayers and heterostructures
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/20/10.1063/1.4834520
10.1063/1.4834520
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