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Detailed photoluminescence studies of thin film Cu2S for determination of quasi-Fermi level splitting and defect levels
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10.1063/1.4850955
/content/aip/journal/jap/114/23/10.1063/1.4850955
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/23/10.1063/1.4850955
/content/aip/journal/jap/114/23/10.1063/1.4850955
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/content/aip/journal/jap/114/23/10.1063/1.4850955
2013-12-17
2014-09-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Detailed photoluminescence studies of thin film Cu2S for determination of quasi-Fermi level splitting and defect levels
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/23/10.1063/1.4850955
10.1063/1.4850955
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