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Cyclic electric field stress on bipolar resistive switching devices
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10.1063/1.4859475
    A. Schulman1,a) and C. Acha1,b)
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    Affiliations:
    1 Laboratorio de Bajas Temperaturas, Departamento de Física, FCEyN - Universidad de Buenos Aires and IFIBA - CONICET, Pabellón I, Ciudad Universitaria, C1428EHA Buenos Aires, Argentina
    a) University of Buenos Aires and CONICET of Argentina scholarships.
    b) Author to whom correspondence should be addressed. Electronic mail: acha@df.uba.ar
    J. Appl. Phys. 114, 243706 (2013); http://dx.doi.org/10.1063/1.4859475
/content/aip/journal/jap/114/24/10.1063/1.4859475
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/24/10.1063/1.4859475
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Figures

Image of FIG. 1.
FIG. 1.

Dependence with the amplitude of  = 80 × 103 square pulses () of the remanent resistance of each contact (low state and high state for the Au and Pt interfaces, respectively). The magnitude is different for each contact as it corresponds to their effective voltage drop. 100 s pulses were applied at 1 kHz rate at a constant temperature (240 K). The high and the low states of these contacts obtained after applying are also shown for comparison. Lines are guides to the eye.

Image of FIG. 2.
FIG. 2.

Relative variation of the remanent resistance of the Au-YBCO interface as a function of the amplitude of the reset pulses () at different temperatures. The pulse treatment corresponds to (a) N = 60 × 103, (b) N = 100 × 103, and (c) N = 500 × 103 square pulses with the same characteristics described in the text. Lines are guides to the eye.

Image of FIG. 3.
FIG. 3.

α as a function of the amplitude of the reset pulses () at 260 K, varying the number of applied pulses. Lines are guides to the eye.

Image of FIG. 4.
FIG. 4.

Electric field stress lifetime curves (V-N curves) at 240 K, where the failure criteria corresponds to an arbitrarily value of α = 10% to 30%. Dotted lines are fits corresponding to Eq. (1) . Slash-dotted lines indicate two possible correction protocols to modify an obtained to a targeted (see text).

Image of FIG. 5.
FIG. 5.

V-N curves at different temperatures for a failure criteria of 20%. Dotted lines are fits corresponding to Eq. (1) . As for cyclic mechanical stress experiments, lowering the temperature shifts the curves to higher voltage stresses.

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/content/aip/journal/jap/114/24/10.1063/1.4859475
2013-12-27
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Cyclic electric field stress on bipolar resistive switching devices
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/24/10.1063/1.4859475
10.1063/1.4859475
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