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Linear thermal expansion coefficient determination using in situ curvature and temperature dependent X-ray diffraction measurements applied to metalorganic vapor phase epitaxy-grown AlGaAs
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10.1063/1.4812369
/content/aip/journal/jap/114/3/10.1063/1.4812369
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/3/10.1063/1.4812369
/content/aip/journal/jap/114/3/10.1063/1.4812369
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/content/aip/journal/jap/114/3/10.1063/1.4812369
2013-07-15
2014-09-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Linear thermal expansion coefficient determination using in situ curvature and temperature dependent X-ray diffraction measurements applied to metalorganic vapor phase epitaxy-grown AlGaAs
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/3/10.1063/1.4812369
10.1063/1.4812369
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