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Interplay of different photoluminescence degradation mechanisms in InGaAlP light emitting diode structures investigated by intense laser excitation
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10.1063/1.4815875
/content/aip/journal/jap/114/3/10.1063/1.4815875
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/3/10.1063/1.4815875
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Principal scheme of the setup used for the PL degradation experiments under high power laser excitation.

Image of FIG. 2.
FIG. 2.

Sample structure with corresponding schematic sketch of the band gap energy and photon energy of the exciting laser used for the PL experiments.

Image of FIG. 3.
FIG. 3.

Degradation behavior of short wavelength LED structures under electrical overstress and optical laser induced photoluminescence degradation experiments. The EL and PL intensities are normalized with the initial ones and , respectively, measured at the beginning of the particular degradation experiment.

Image of FIG. 4.
FIG. 4.

Photoluminescence degradation behavior for different stress laser power densities under intense laser excitation (symbols) and corresponding fit curves after the model of Lam (solid lines).

Image of FIG. 5.
FIG. 5.

Dependence of the defect evolution rate describing the negative PL degradation component on stress laser power density (symbol) with corresponding parabolic fit (solid line).

Image of FIG. 6.
FIG. 6.

Dependence of the weighting parameters and of the initial number of defects of type 2 on the stress laser power.

Image of FIG. 7.
FIG. 7.

PL degradation behavior for different measurement laser power densities stressed with the same laser power density (symbols) and corresponding fit curves after the model of Lam (solid lines).

Image of FIG. 8.
FIG. 8.

Dependence of the weighting parameters and of the three PL degradation mechanisms on the measurement laser power densities (symbols). The dashed lines are guides for the eyes.

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/content/aip/journal/jap/114/3/10.1063/1.4815875
2013-07-17
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interplay of different photoluminescence degradation mechanisms in InGaAlP light emitting diode structures investigated by intense laser excitation
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/3/10.1063/1.4815875
10.1063/1.4815875
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