Temperature dependent electrical resistivity and magnetization of the YBaMn2O6 sample. Magnetization was measured under a magnetic field of 200 Oe on ZFC and FC processes.
Temperature dependent XRD patterns of YBaMn2O6 between 15 and 70 K.
Normalized magnetization M(t)/M(0) as a function of time for YBaMn2O6 at 33 and 80 K. The sample was cooled down to the specified temperatures without magnetic field, and then the magnetization data were collected immediately under a magnetic field of 200 Oe.
TRM measurement at 33 K. The dash line displays the fitting result. The sample was cooled down to 33 K in a magnetic field of 400 Oe. The magnetization data were collected immediately after the field being removed.
The temperature dependences of ZFC magnetizations in an applied field of 500 Oe. (open circles) denotes the magnetization with the measurement stopped at 32 K and waited for 2 h, and (solid circles) is the reference magnetization without the stop and wait treatment. The inset shows the difference between the two ZFC magnetizations.
The low-temperature specific heat from 2 to 150 K for the YBaMn2O6 sample, plotted as C/T vs T. The inset shows the fitting to data with C = C latt + C mag.
Selected regions of normalized XRD patterns for ordered (calculated) structure, disordered (calculated) structure, and experimental sample. Inset shows the amplified (001) peak for comparison.
Fitting results of the TRM relaxation with different decay models.
Normalized integrated Intensities of selected peaks of calculated and experimental XRD patterns.
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