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Efficient broken line fitting procedure for analysis of force spectroscopy curves in chemical force microscopy
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10.1063/1.4817867
/content/aip/journal/jap/114/6/10.1063/1.4817867
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/6/10.1063/1.4817867

Figures

Image of FIG. 1.
FIG. 1.

Schematic of one cycle of force spectroscopy measurement.

Image of FIG. 2.
FIG. 2.

Force-distance curve measured in air.

Image of FIG. 3.
FIG. 3.

Example of force-distance retract curves: low amplitude adhesion force (a) and the base line distortion (b).

Image of FIG. 4.
FIG. 4.

Broken line curve used to model force-distance curves.

Image of FIG. 5.
FIG. 5.

Force curve patterns with indicated adhesion forces: (a) with baseline drift and (b) without baseline drift.

Image of FIG. 6.
FIG. 6.

Illustration of inefficiency of the standard methods of snap-out point detections for the FNR = 2: (a) illustration of smoothing operation (deterioration of peak amplitude in smoothed signals), (b) in the smoothed signals the remaining noise prevents us from the snap-out point detection.

Image of FIG. 7.
FIG. 7.

The force curve patterns with Gaussian noise and the broken line model fitted to this data.

Image of FIG. 8.
FIG. 8.

The histogram of the adhesion force of the CH-CH interactions and its Gauss fit.

Tables

Generic image for table
Table I.

The results of the analysis of simulated force curves.

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/content/aip/journal/jap/114/6/10.1063/1.4817867
2013-08-14
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Efficient broken line fitting procedure for analysis of force spectroscopy curves in chemical force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/6/10.1063/1.4817867
10.1063/1.4817867
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