(a) XRD θ-2θ scan for the LCEMO/PMN-PT structure. Left panel: the rocking curve taken around LCEMO (002) diffraction peak. Right panel: the off-axis θ-2θ scan data obtained by tilting the film plane at an angle of 45°. (b) XRD phi scans taken on the LCEMO (101) and PMN-PT (101) diffraction peaks, respectively. (c) Out-of-plane piezo-strain versus E curve for the PMN-PT substrate at T = 296 K. (d) The AFM image of the LCEMO film.
Temperature dependence of the resistance for the LCEMO film when the PMN-PT substrate was in positively and negatively polarized states. The inset shows the relative change in the resistance, [ ], of the LCEMO film with the reversal of the polarization direction.
Electric-field-induced change in the resistance of the LCEMO film at several fixed temperatures as a function of bipolar electric field applied to the PMN-PT substrate.
Temperature dependence of the magnetization for the LCEMO film when the PMN-PT substrate was in positively and negatively polarized states, respectively. The inset shows the in-plane magnetic hysteresis loops M(H) for the two polarization states of the PMN-PT substrate.
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