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Residual stress inspection by Eu3+ photoluminescence piezo-spectroscopy: An application in thermal barrier coatings
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10.1063/1.4818500
/content/aip/journal/jap/114/7/10.1063/1.4818500
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/7/10.1063/1.4818500
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of YSZ:Eu powders prepared by atmospheric plasma spraying. The patterns of slow scan in the high degree range are shown in the inset and the peak profile was fitted by Gaussian function.

Image of FIG. 2.
FIG. 2.

SEM images for the fractured cross sections of 8YSZ:Eu coating with different magnifications.

Image of FIG. 3.
FIG. 3.

Luminescence spectra of the powder sample, excited by the 514.5 nm laser under increasing pressures: (a) the main peak of DF transition of Eu ions, (b) the variation of peak position with pressure.

Image of FIG. 4.
FIG. 4.

Micro-photoluminescence spectrum of Eu ions in YSZ:Eu sublayer in the TBC.

Image of FIG. 5.
FIG. 5.

The measured residual stresses in the luminescence sublayer of TBC sample. The TBC sample is shown in the top right of the figure. Only twelve spots in a quarter of the sample (indicated by the thick grey line on the bottom) were chosen to measure the stresses. The height of the bar indicates the value of the stress in a spot measured by the laser.

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/content/aip/journal/jap/114/7/10.1063/1.4818500
2013-08-15
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Residual stress inspection by Eu3+ photoluminescence piezo-spectroscopy: An application in thermal barrier coatings
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/7/10.1063/1.4818500
10.1063/1.4818500
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