Schematic illustration of the measurement apparatus (laser vibrometry) for in situ temperature-dependent piezoelectric coefficients.
Temperature evolution of the piezoelectric coefficient as a function of the BT content (x) in (65-x)PMN-xBT-35PT ceramics.
Temperature evolution of impedance vs. frequency (a) and piezoelectric resonance frequency for (65-x)PMN-xBT-35PT ceramics (b).
Thermal variation of the dielectric permittivity and dielectric loss of (65-x)PMN-xBT-35PT ceramics.
Raman spectra of the (65-x)PMN-xBT-35PT ceramics with different compositions x at temperatures 83 K, 173 K, 253 K, and 333 K.
Temperature evolution of the Raman spectra of 64PMN-BT-35PT.
Deconvolution procedure of the Raman spectra of 64PMN-BT-35PT in terms of individual Raman lines from active modes involved in the crystalline structure.
The temperature evolution of the intensity ratio of the mode at 521 cm−1 and other two modes at 746 and 800 cm−1 for (65-x)PMN-xBT-35PT ceramics.
Temperature and composition dependences of Raman line frequency at 277 cm−1.
Temperature and composition dependences of low wavenumber Raman spectra.
The temperature evolution of the intensity ratio at the mode at 58 cm−1 and that at 100 cm−1 for (65-x)PMN-xBT-35PT ceramics.
Article metrics loading...
Full text loading...