1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Possible surface plasmon polariton excitation under femtosecond laser irradiation of silicon
Rent:
Rent this article for
USD
10.1063/1.4818433
/content/aip/journal/jap/114/8/10.1063/1.4818433
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/8/10.1063/1.4818433

Figures

Image of FIG. 1.
FIG. 1.

Real part of the dielectric function of Si as a function of photon energy compared to the plasma frequency . If the plasma frequency is located on the left of the resonance peak, surface mode is not bounded to the surface and SPP are not allowed. If the plasma frequency is located on the right of the surface plasmon polariton resonance peak, the SPPs are allowed.

Image of FIG. 2.
FIG. 2.

(a) Minimum of the real part of the dielectric function as a function of laser fluence. Blue line indicates the threshold for SPP excitation, e.g., . (b) Maximum of the reached density during the interaction as a function of laser fluence. Blue line indicates critical density, e.g., . . Several laser pulse durations are represented.

Image of FIG. 3.
FIG. 3.

Fluence threshold for SPP resonance as a function of pulse duration.

Image of FIG. 4.
FIG. 4.

Distribution of the dielectric function as a function of depth and time. .

Image of FIG. 5.
FIG. 5.

Transmitted field amplitude below the selvedge region of Si. Roughness amplitude is (a) , (b) , (c) at wavelength 800 nm. In these simulations, .

Image of FIG. 6.
FIG. 6.

Wavelength normalized period of SPP as a function of free-carrier density at vacuum-Si interface when the conditions of resonance are met.

Image of FIG. 7.
FIG. 7.

Experimental measurements of the LSFL periods, as a function of laser fluence. . The periods resulting from theoretical investigations are also represented.

Image of FIG. 8.
FIG. 8.

Ripple periodicity as a function of angle of incidence and laser polarization after 10 laser pulses. Pulse duration is 100 fs, and laser wavelength is 800 nm.

Tables

Generic image for table
Table I.

The calculation parameters for c-Si under 800 nm irradiation.

Loading

Article metrics loading...

/content/aip/journal/jap/114/8/10.1063/1.4818433
2013-08-23
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Possible surface plasmon polariton excitation under femtosecond laser irradiation of silicon
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/8/10.1063/1.4818433
10.1063/1.4818433
SEARCH_EXPAND_ITEM