Enlarged view of (200) reflection for two types of LSCO film grown on LAO [(a) and (b)] with thickness ∼150 nm. (c) Shows the reciprocal space map (RSM) around (−203) reflection of the film corresponding to (a). Aschematic view of lattice arrangement in this film is shown in (d). (e) and (f) Texture analysis performed around (110) reflection of LAO substrate and (220) reflection LSCO film corresponding to the sample in (a). Φ varied from 0 to 360° for each value of χ (0–90°).
Temperature dependence of the normalized in-phase ZFC ac susceptibility component (χ′) for 150 nm LSCO grown on LAO at various time intervals after growth. The inset shows the variation of TC with time.
Enlarged view of (200) reflection for 150 nm LSCO film grown on STO (a). (b) Temperature dependence of the in-phase ZFC ac susceptibility component (χ′) for the same film.
(a) Temperature dependent resistance variation for 150 nm LSCO thin film grown on LAO. The upper inset displays the derivative (dR/dT) and the vertical line indicates the maximum change in slope around 253 K. The lower inset shows the metallic behavior throughout the temperature range for an aged LSCO film after ∼300 days of sample preparation. (b) The temperature dependence of the in-phase component of ac susceptibility, χ′(T), at 420 Hz and with an ac magnetic field of 170 mOe. (c)The temperature dependence of field-cooled dc magnetization after 75 days. (d) The temperature dependence of the in-phase ac susceptibility component, χ′(T), after 75 days.
Effect of the most influencing growth parameters on TC of La0.5Sr0.5CoO3 thin-films.
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