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Temperature dependence of the thermal properties of InSb materials used in data storage
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Image of FIG. 1.
FIG. 1.

XRD patterns of InSb powder in the scan range of , and the X-ray source is radiation with a wavelength of 0.154 nm.

Image of FIG. 2.
FIG. 2.

TGA curve as a function of temperature for InSb sample. In the testing, approximately InSb powder was filled in standard AlO crucible and scanned at a fixed heating rate of from room temperature to approximately .

Image of FIG. 3.
FIG. 3.

Dependence of specific heat of InSb on temperature. The specific heat was obtained by thermo-mechanical analysis at a heating rate of . The sample was also ground into powder and Pt/AlO crucible was employed to load the sample. (a) Specific heat as a function of temperature. (b) Detailed temperature dependence of specific heat in the range from to .

Image of FIG. 4.
FIG. 4.

Temperature dependence of thermal expansion coefficient at a heating rate of . The sample in the measurement had diameter and length. To avoid the oxidation the measurement was conducted under inert atmosphere.

Image of FIG. 5.
FIG. 5.

Temperature dependence of thermal diffusivity measured with a heating rate of . The size of the sample in the measurement was in diameter with a thickness of .

Image of FIG. 6.
FIG. 6.

Temperature dependence of thermal conductivity, and the thermal conductivity was directly obtained using NETZSCH analysis software package with consideration of thermal expansion.


Generic image for table
Table I.

Comparison of the thermal parameters of Sb, SbTe, and InSb at room temperature.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Temperature dependence of the thermal properties of InSb materials used in data storage