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Study of Au/Hg3In2Te6 interface by synchrotron radiation photoemission spectroscopy
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10.1063/1.4819438
/content/aip/journal/jap/114/8/10.1063/1.4819438
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/8/10.1063/1.4819438
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SRPES of Hg 4d, In 4d, and Te 4d core level at different etching time.

Image of FIG. 2.
FIG. 2.

The element concentration for Hg, In, and Te under different etching time.

Image of FIG. 3.
FIG. 3.

Schematic diagram of MIT surface under different etching times, (a) before etching, (b) 0∼10 min, (c)10∼40 min, (d) 40∼120 min.

Image of FIG. 4.
FIG. 4.

Te 4d and In 4d core levels of the MIT surface for various Au coverage (a) Te 4d and (b) In 4d.

Image of FIG. 5.
FIG. 5.

The intensities variation for Te, In, and Au peaks during the deposition process.

Image of FIG. 6.
FIG. 6.

Experimental results and calculated curves of Te 4d / ratio as a function of Au film deposition thickness, indicating a VW growth mode for Au at MIT surface.

Image of FIG. 7.
FIG. 7.

SRPES of Au 4f core levels with different Au deposition thickness.

Image of FIG. 8.
FIG. 8.

Te 4d core level photoemission spectra (dotted lines) with different Au coverage. The decomposed components of each peak are illustrated in the figure.

Image of FIG. 9.
FIG. 9.

In 4d core level photoemission spectra (dotted lines) with different Au coverage. The decomposed peaks are shown similar like Te 4d spectra.

Image of FIG. 10.
FIG. 10.

Au/In and Te/In ratios as a function of Au coverage.

Image of FIG. 11.
FIG. 11.

The schematic figure of the Au/MIT interface formation process with different Au coverage. As in Fig. 3 , different atom species were marked by colors. (a) clean surface, (b) 0∼1.3 ML, (c) 1.3∼7.2 ML, (d) 7.2∼15 ML, (e) 15∼25 ML, and (f) the final interface.

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/content/aip/journal/jap/114/8/10.1063/1.4819438
2013-08-30
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Study of Au/Hg3In2Te6 interface by synchrotron radiation photoemission spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/114/8/10.1063/1.4819438
10.1063/1.4819438
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