(a) Top view. (b) Cross section SEM images of a ZnO1− x S x film (x = 11.9%).
(a) XRD patterns of ZnO1− x S x films grown on glass substrates with different S content. (b) Grazing incidence X-ray diffraction pattern of ZnS film. Reflections can take place from planes inclined to the surface (inset). (c) XRD patterns of (0002) peak in ZnO1− x S x films with different S content in O-rich side. The S content increases from the left to the right: (1) 0%, (2) 2.1%, (3) 7.9%, (4) 9.7%, and (5) 11.9%. The curves have been normalized for clarity. (d) The lattice constant c of ZnO1− x S x films as a function of S content. The square dot and solid line indicate the results of XRD and Vegard's law.
Narrow-scan XPS spectra of (a) Zn 2p3/2, (b) O 1s, and (c) S 2p in ZnO1− x S x film with a composition of x = 11.9%.
Plots of (αhv)2 vs photo energy for ZnO1− x S x films with various S contents. Inset shows dependence of Eg on S content deduced from the adsorption edge.
Normalized PL spectra at band-edge region observed at room temperature.
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