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Investigation of cellular microstructure and enhanced coercivity in sputtered Sm2
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We have investigated the effect of annealing temperature on the microstructure and magnetic properties of Sm2(CoCuFeZr)17 films prepared using ion beam sputtering at room temperature. The as-deposited film shows randomly oriented polycrystalline grains and exhibits small coercivity (H C) of 0.04 T at room temperature. Post annealing of these films at 700 °C under Ar atmosphere shows significant changes in the microstructure transforming it to the development of cellular growth, concomitant with enhanced coercivity up to 1.3 T. The enhanced coercivity is explained using the domain wall pinning mechanism.
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