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/content/aip/journal/jap/115/11/10.1063/1.4868864
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/content/aip/journal/jap/115/11/10.1063/1.4868864
2014-03-18
2016-09-30

Abstract

The problem of non-standard scaling of the 1/f noise in thin manganite films was revisited in the above paper, suggesting the quantum theory of fundamental flicker noise for the interpretation of the unusual dependence of the normalized Hooge parameter on the sample volume. Experimental evidence has been reported, showing that in these materials such volume dependence is, instead, an artifact of extrinsic noise sources, e.g., contact noise. Moreover, the proposed theoretical model implies a linear temperature dependence of the Hooge parameter, which is against the experimental data reported here. Based on these arguments, it is possible to conclude that the quantum theory of fundamental flicker noise cannot be applied to the case of LaSrMnO thin films.

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