NOTICE: Scitation Maintenance Sunday, March 1, 2015.

Scitation users may experience brief connectivity issues on Sunday, March 1, 2015 between 12:00 AM and 7:00 AM EST due to planned network maintenance.

Thank you for your patience during this process.

1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Influence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cells
Rent:
Rent this article for
USD
10.1063/1.4863722
/content/aip/journal/jap/115/5/10.1063/1.4863722
http://aip.metastore.ingenta.com/content/aip/journal/jap/115/5/10.1063/1.4863722
/content/aip/journal/jap/115/5/10.1063/1.4863722
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/jap/115/5/10.1063/1.4863722
2014-02-03
2015-03-01
Loading

Full text loading...

Most read this month

Article
content/aip/journal/jap
Journal
5
3
Loading
This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cells
http://aip.metastore.ingenta.com/content/aip/journal/jap/115/5/10.1063/1.4863722
10.1063/1.4863722
SEARCH_EXPAND_ITEM