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Influence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cells
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10.1063/1.4863722
/content/aip/journal/jap/115/5/10.1063/1.4863722
http://aip.metastore.ingenta.com/content/aip/journal/jap/115/5/10.1063/1.4863722
/content/aip/journal/jap/115/5/10.1063/1.4863722
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/content/aip/journal/jap/115/5/10.1063/1.4863722
2014-02-03
2014-10-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cells
http://aip.metastore.ingenta.com/content/aip/journal/jap/115/5/10.1063/1.4863722
10.1063/1.4863722
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