No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Erratum: “A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images” [J. Appl. Phys. 116
, 104905 (2014)]
1. F. Wu, H. Wang, B. Raghothamachar, M. Dudley, S. G. Mueller, G. Chung, E. K. Sanchez, D. Hansen, M. J. Loboda, L. Zhang, D. Su, K. Kisslinger, and E. Stach, J. Appl. Phys. 116, 104905 (2014).
Article metrics loading...
There is no abstract available for this article.
Full text loading...
Most read this month