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/content/aip/journal/jap/116/4/10.1063/1.4891522
1.
1. T.-y. Chung, C.-H. Wang, K.-J. Chang, S.-Y. Chen, H.-H. Hsieh, C.-P. Huang, and C.-H. Arthur Cheng, “ Evaluation of the spatial distribution of series and shunt resistances of a solar cell using dark lock-in thermography,” J. Appl. Phys. 115, 034901 (2014).
http://dx.doi.org/10.1063/1.4862297
2.
2. G. Araujo, A. Cuevas, and J. M. Ruiz, “ The effect of distributed series resistance on the dark and illuminated current-voltage characteristics of solar cells,” IEEE Trans. Electron Devices 33, 391401 (1986).
http://dx.doi.org/10.1109/T-ED.1986.22500
3.
3. O. Breitenstein, “ Nondestructive local analysis of current-voltage characteristics of solar cells by lock-in thermography,” Sol. Energy Mater. Sol. Cells 95, 29332936 (2011).
http://dx.doi.org/10.1016/j.solmat.2011.05.049
4.
4. H. Straube and O. Breitenstein, “ Infrared lock-in thermography through glass substrates,” Sol. Energy Mater. Sol. Cells 95, 27682771 (2011).
http://dx.doi.org/10.1016/j.solmat.2011.05.017
http://aip.metastore.ingenta.com/content/aip/journal/jap/116/4/10.1063/1.4891522
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/content/aip/journal/jap/116/4/10.1063/1.4891522
2014-07-28
2016-12-10

Abstract

In a recent article, Chung [J. Appl. Phys. , 034901 (2014)] proposed a novel method to measure series resistances in solar cells quantitatively by dark lock-in thermography. However, the theory to this method contains a mathematical fault; therefore, the method cannot work as expected. Some unphysical predictions and consequences of this theory are reported.

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