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Comment on “Evaluation of the spatial distribution of series and shunt resistance of a solar cell using dark lock-in thermography” [J. Appl. Phys. 115
, 034901 (2014)]
1. T.-y. Chung, C.-H. Wang, K.-J. Chang, S.-Y. Chen, H.-H. Hsieh, C.-P. Huang, and C.-H. Arthur Cheng, “ Evaluation of the spatial distribution of series and shunt resistances of a solar cell using dark lock-in thermography,” J. Appl. Phys. 115, 034901 (2014).
2. G. Araujo, A. Cuevas, and J. M. Ruiz, “ The effect of distributed series resistance on the dark and illuminated current-voltage characteristics of solar cells,” IEEE Trans. Electron Devices 33, 391–401 (1986).
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In a recent article, Chung et al. [J. Appl. Phys. 115, 034901 (2014)] proposed a novel method to measure series resistances in solar cells quantitatively by dark lock-in thermography. However, the theory to this method contains a mathematical fault; therefore, the method cannot work as expected. Some unphysical predictions and consequences of this theory are reported.
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