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Erratum: “High-resolution X-ray diffraction analysis of Alx
N/GaN on sapphire multilayer structures: Theoretical, simulations, and experimental observations” [J. Appl. Phys. 115
, 174507 (2014)]
1. S. K. Jana, P. Mukhopadhyay, S. Ghosh, S. Kabi, A. Bag, R. Kumar, and D. Biswas, “ High-resolution X-ray diffraction analysis of AlxGa1−xN/InxGa1−xN/GaN on sapphire multilayer structures: Theoretical, simulations, and experimental observations,” J. Appl. Phys. 115, 174507 (2014).
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