Skip to main content
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
H. M. Ng, T. D. Moustakas, and S. N. G. Chu, Appl. Phys. Lett. 76(20), 2818 (2000).
K. E. Waldrip, J. Han, J. J. Figiel, H. Zhou, E. Makarona, and A. V. Nurmikko, Appl. Phys. Lett. 78, 3205 (2001).
J.-F. Carlin, J. Dorsaz, E. Feltin, R. Butte, N. Grandjean, M. Ilegens, and M. Laügt, Appl. Phys. Lett. 86, 031107 (2005).
N. Nakada, M. Nakaji, H. Ishikawa, T. Egawa, M. Umeno, and T. Jimbo, Appl. Phys. Lett. 76, 1804 (2000).
T. Someya, R. Werner, A. Forchel, M. Catalano, R. Cingolani, and Y. Arakawa, Science 285(5435), 1905 (1999).
T.-C. Lu, C.-C. Kao, H. C. Kuo, G. S. Huang, and S.-C. Wang, Appl. Phys. Lett. 92, 141102 (2008).
R. Butte and N. Grandjean, Semicond. Sci. Technol. 26, 014030 (2011).
H. Morkoc, Handbook of Nitride Semiconductors and Devices ( Wiley-VCH Verlag GmbH, Weinheim, 2009), Vol. 3.
J.-F. Carlin and M. Ilegems, Appl. Phys. Lett. 83, 668 (2003).
A. Franke, B. Bastek, J. Krimmling, J. Christen, P. Moser, A. Dadgar, and A. Krost, Superlattices Microstruct. 49, 187192 (2011).
A. Bhattacharyya, S. Iyer, E. Iliopoulos, A. V. Sampath, J. Cabalu, T. D. Moustakas, and I. Friel, J. Vac. Sci. Technol., B 20(3), 12291233 (2002).
O. Mitrofanov, S. Schmult, M. J. Manfra, T. Siegrist, N. G. Weimann, A. M. Sergent, and R. J. Molnar, Appl. Phys. Lett. 88, 171101 (2006).
E. Feltin, J.-F. Carlin, J. Dorsaz, G. Christmann, R. Butte, M. Laügt, M. Ilegems, and N. Grandjean, Appl. Phys. Lett. 88, 051108 (2006).
C. Berger, A. Dadgar, J. Bläsing, A. Franke, T. Hempel, R. Goldhahn, J. Christen, and A. Krost, Phys. Status Solidi C 9(5), 12531258 (2012).
C. G. Moe, Y. Wu, J. Piprek, S. Keller, J. S. Speck, S. P. DenBaars, and D. Emerson, Phys. Status Solidi A 203(8), 1915 (2006).
L. Zhang, K. Dong, D. Chen, Y. Liu, J. Xue, H. Lu, R. Zhang, and Y. Zheng, Appl. Phys. Lett. 102, 242112 (2013).
A. R. K. Getty, A. David, Y. Wu, C. Weisbuch, and J. S. Speck, Jpn. J. Appl. Phys., Part 1 46(32), 767 (2007).
S. Mita, R. Collazo, A. Rice, R. F. Dalmau, and Z. Sitar, J. Appl. Phys. 104, 013521 (2008).
M. Rigler, M. Zgonik, M. P. Hoffmann, R. Kirste, M. Bobea, R. Collazo, Z. Sitar, S. Mita, and M. Gerhold, Appl. Phys. Lett. 102, 221106 (2013).
D. Brunner, H. Angerer, B. Bustarret, F. Freudenberg, R. Höpler, R. Dimitrov, O. Ambacher, and M. Stutzmann, J. Appl. Phys. 82, 5090 (1997).
Ü. Ötgür, G. Webb-Wood, H. O. Everitt, F. Yun, and H. Morkoc, Appl. Phys. Lett. 79, 4103 (2001).
N. A. Sanford, L. H. Robins, A. V. Davydov, A. Shapiro, D. V. Tsvetkov, A. V. Dmitriev, S. Keller, U. K. Mishra, and S. P. DenBaars, J. Appl. Phys. 94, 2980 (2003).
H. A. Macleod, Thin-Film Optical Filters, 3rd ed. ( CRC Press, 2001).
R. Hull, J. C. Bean, F. Cerdeira, A. T. Fiory, and J. M. Gibson, Appl. Phys. Lett. 48(1), 56 (1986).
D. Ehrentraut and Z. Sitar, MRS Bull. 34, 259 (2009).
Z. Bryan, I. Bryan, J. Xie, S. Mita, Z. Sitar, and R. Collazo, Appl. Phys. Lett. 106, 142107 (2015).

Data & Media loading...


Article metrics loading...



UV-C distributed Bragg reflectors (DBRs) for vertical cavity surface emitting laser applications and polariton lasers are presented. The structural integrity of up to 25 layer pairs of AlN/AlGaN DBRs is maintained by balancing the tensile and compressive strain present between the single layers of the multilayer stack grown on top of an Al GaN template. By comparing the structural and optical properties for DBRs grown on low dislocation density AlN and AlGaN templates, the criteria for plastic relaxation by cracking thick nitride Bragg reflectors are deduced. The critical thickness is found to be limited mainly by the accumulated strain energy during the DBR growth and is only negligibly affected by the dislocations. A reflectance of 97.7% at 273 nm is demonstrated. The demonstrated optical quality and an ability to tune the resonance wavelength of our resonators and microcavity structures open new opportunities for UV-C vertical emitters.


Full text loading...


Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd