A Method for Measuring the Total Power of Small‐Angle X‐Ray Scattering
1.A method for using the double crystal spectrometer to measure the intensity, rather than the total power of small‐angle scattering, has been described by I. Fankuchen and M. H. Jellinek, Phys. Rev. 67, 201 (1945).
2.J. Biscoe and B. E. Warren, J. App. Phys. 13, 364 (1942).
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Article metrics loading...
Full text loading...
Most read this month
Most cited this month