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Stress Anisotropy in Ni‐Fe Thin Films
1.J. Ross MacDonald, Phys. Rev. 106, 890 (1957).
2.H. Levenstein, J. Appl. Phys. 20, 206 (1949). Ni‐Fe thin films subjected to particle size determinations by x‐ray techniques in our laboratories by R. R. Verderber on a number of evaporated Ni‐Fe samples substantiate a microcrystal interpretation. The average particle size was determined as 100 A.
3.P. K. Baltzer, Phys. Rev. 108, 580 (1957).
4.Baltzer defines and as the anisotropy constants for the special case of “an undeformed crystal,” i.e., “one which has not been permitted to deform due to magnetostriction or externally applied stresses.”
5.Preliminary x‐ray orientation studies on evaporated Ni‐Le thin films by R. R. Verderber of our laboratories indicate a 10% preferred orientation of (111) fiber axes perpendicular to the film plane.
6.R. M. Bozorth and J. G. Walker, Phys. Rev. 89, 624 (1953).
7.F. Hegg, Arch. Sci. Phys. et Nat. 29, 592;
7.F. Hegg, 30, 15 (1910).
8.This is the maximum field obtainable on the measuring loop tracer.
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