Effect of Thermal Motion on the X‐Ray Reflectivity of Quartz
1.P. Debye, Ann. Physik 43, 49 (1914)
1.[English translation in The Collected Papers of Peter J. W. Debye (Interscience Publishers, Inc., New York, 1954)].
2.I. Waller, Z. Physik 23, 169 (1928).
3.R. W. James, The Optical Principles of the Diffraction of X‐Rays (G. Bell and Sons, Ltd., London, 1950).
4.E. J. Post, Can. J. Phys. 31, 112 (1953).
5.The unit cell dimensions of quartz were derived from Bragg spacings measured by Adell, Brogren, and Haeggblom, Arkiv Physik 7, 197 (1953).
6.W. P. Mason, Bell System Tech. J. 22, 212 (1943).
7.See W. L. Bond, Bell System Tech. J. 22, 27 (1943), for an explanation of notation.
8.See reference 3, p. 219.
9.C. Zener, Phys. Rev. 49, 112 (1936).
10.See A. Compton and S. Allison, X‐Rays in Theory and Experiment (D. Van Nostrand Company, Inc., Princeton, New Jersey, 1935), p. 6.
11.The quartz plate was made to our specifications by the Monitor Products Company of South Pasadena, California.
12.Y. Sakisaka, Proc. Phys.‐Math. Soc. Japan 12, 189 (1930).
13.Derivation of the integrated reflection coefficient formula is given in reference 3, Chap. 2.
14.Brill, Hermann, and Peters, Ann. Phys. 41, 233 (1942).
15.R. W. James and G. W. Brindley, Phil. Mag. 12, 104 (1931).
16.Values of reflectivity assuming a characteristic temperature of 460 °K were computed to make Table I. Since 460 °K is within the limits of experimental error, the reflectivities were not computed again using 452 °K.
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