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X‐ray diffraction topographs of silicon crystals with superposed oxide film. II. Pendellösung fringes: comparison of experiment with theory
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10.1063/1.1662380
/content/aip/journal/jap/44/3/10.1063/1.1662380
http://aip.metastore.ingenta.com/content/aip/journal/jap/44/3/10.1063/1.1662380
/content/aip/journal/jap/44/3/10.1063/1.1662380
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/content/aip/journal/jap/44/3/10.1063/1.1662380
2003-10-09
2014-12-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X‐ray diffraction topographs of silicon crystals with superposed oxide film. II. Pendellösung fringes: comparison of experiment with theory
http://aip.metastore.ingenta.com/content/aip/journal/jap/44/3/10.1063/1.1662380
10.1063/1.1662380
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