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/content/aip/journal/jap/45/7/10.1063/1.1663719
1.
1.A. A. Bergh and P. J. Dean, Proc. IEEE 60, 156 (1972).
2.
2.C. T. Sah and J. W. Walker, Appl. Phys. Lett. 22, 384 (1973).
3.
3.J. C. Carballes, J. Varon, and T. Ceva, Solid State Commun. 9, 1627 (1971);
3.C. T. Sah, W. W. Chan, H. S. Fu, and J. W. Walker, Appl. Phys. Lett. 20, 193 (1972);
3.M. G. Buehler, Solid‐State Electron. 15, 69 (1972).
4.
4.D. L. Losee, Appl. Phys. Lett. 21, 54 (1972).
5.
5.The capacitance transient technique was first used by R. Williams, J. Appl. Phys. 37, 3411 (1966).
6.
6.A comprehensive treatment of capacitance and current transients is given by C. T. Sah, L. Forbes, L. L. Rosier, and A. F. Tasch, Jr., Solid‐State Electron. 13, 759 (1970).
7.
7.D. V. Lang, preceding paper, J. Appl. Phys. 45, 3014 (1974).
8.
8.L. D. Yau and C. T. Sah, Phys. Status Solidi A 6, 561 (1971).
9.
9.C. H. Henry, H. Kukimoto, G. L. Miller, and F. R. Merritt, Phys. Rev. B 7, 2499 (1973).
10.
10.H. Kukimoto, C. H. Henry, and F. R. Merritt, Phys. Rev. B 7, 2486 (1973).
11.
11.This is referred to as a clear pulse in Ref. 7.
12.
12.Princeton Applied Research model 162 with model 164 gate modules.
13.
13.A. Y. Cho, J. Vac. Sci. Technol. 8, S31 (1971).
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2003-10-06
2016-08-25
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