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Annealing behavior of In implanted in Si studied by perturbed angular correlation
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10.1063/1.324216
/content/aip/journal/jap/48/8/10.1063/1.324216
http://aip.metastore.ingenta.com/content/aip/journal/jap/48/8/10.1063/1.324216
/content/aip/journal/jap/48/8/10.1063/1.324216
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/content/aip/journal/jap/48/8/10.1063/1.324216
2008-08-26
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Annealing behavior of In implanted in Si studied by perturbed angular correlation
http://aip.metastore.ingenta.com/content/aip/journal/jap/48/8/10.1063/1.324216
10.1063/1.324216
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