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Structure and optical properties of evaporated films of the Cr‐ and V‐group metals
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2.J. E. Nestell, Jr., Ph.D. Thesis, Dartmouth College, 1979. For the well‐annealed films, see also J. E. Nestell, Jr., and R. W. Christy, Phys. Rev. B (to be published).
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8.This precaution was unnecessary: the opaque reflectance calculated from the n and k determined from thin‐film measurements agreed well with the reflectance actually measured for opaque films deposited under similar conditions of vacuum and deposition rate.
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10.In Gaussian units, the complex dielectric function is given by and the complex conductivity by To have the units in divide σ by
11.The x‐ray diffractometer could record x‐ray reflections only from lattice planes parallel to the substrate.
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15.Since the electron beam samples only a small area, it is less likely that large grains will be found with all possible orientations because fewer will be sampled. This will lead to a spotty appearance of the diffraction ring since diffraction in some directions will be missing.
16.As noted, evaporated films of these refractory metals are also highly strained; but it is unlikely that even 1% strain could account for the optical anomalies that were observed.
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25.This assumption holds for light of normal incidence or s polarization, but is only an approximation for p polarization.
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32.Surface roughness is another possible cause of reduced reflectance, but is excluded here for reasons discussed in Ref. 1.
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