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Calculation of the infrared reflection spectra of inhomogeneously doped silicon semiconductor layers at an arbitrary angle of incidence
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10.1063/1.336406
/content/aip/journal/jap/59/6/10.1063/1.336406
http://aip.metastore.ingenta.com/content/aip/journal/jap/59/6/10.1063/1.336406
/content/aip/journal/jap/59/6/10.1063/1.336406
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/content/aip/journal/jap/59/6/10.1063/1.336406
1986-03-15
2014-12-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Calculation of the infrared reflection spectra of inhomogeneously doped silicon semiconductor layers at an arbitrary angle of incidence
http://aip.metastore.ingenta.com/content/aip/journal/jap/59/6/10.1063/1.336406
10.1063/1.336406
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