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Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique
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10.1063/1.341024
/content/aip/journal/jap/63/7/10.1063/1.341024
http://aip.metastore.ingenta.com/content/aip/journal/jap/63/7/10.1063/1.341024
/content/aip/journal/jap/63/7/10.1063/1.341024
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/content/aip/journal/jap/63/7/10.1063/1.341024
1988-04-01
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique
http://aip.metastore.ingenta.com/content/aip/journal/jap/63/7/10.1063/1.341024
10.1063/1.341024
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