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The role of small‐impact‐parameter electron‐loss processes on ion temperatures measured by active‐beam plasma diagnostics
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10.1063/1.343375
/content/aip/journal/jap/65/1/10.1063/1.343375
http://aip.metastore.ingenta.com/content/aip/journal/jap/65/1/10.1063/1.343375
/content/aip/journal/jap/65/1/10.1063/1.343375
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/content/aip/journal/jap/65/1/10.1063/1.343375
1989-01-01
2014-10-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The role of small‐impact‐parameter electron‐loss processes on ion temperatures measured by active‐beam plasma diagnostics
http://aip.metastore.ingenta.com/content/aip/journal/jap/65/1/10.1063/1.343375
10.1063/1.343375
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