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Determination of crystallographic orientations in silicon films by Raman‐microprobe polarization measurements
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10.1063/1.342787
/content/aip/journal/jap/65/7/10.1063/1.342787
http://aip.metastore.ingenta.com/content/aip/journal/jap/65/7/10.1063/1.342787
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/content/aip/journal/jap/65/7/10.1063/1.342787
1989-04-01
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of crystallographic orientations in silicon films by Raman‐microprobe polarization measurements
http://aip.metastore.ingenta.com/content/aip/journal/jap/65/7/10.1063/1.342787
10.1063/1.342787
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