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The calibration of the strength of the localized vibrational modes of silicon impurities in epitaxial GaAs revealed by infrared absorption and Raman scattering
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10.1063/1.344224
/content/aip/journal/jap/66/6/10.1063/1.344224
http://aip.metastore.ingenta.com/content/aip/journal/jap/66/6/10.1063/1.344224
/content/aip/journal/jap/66/6/10.1063/1.344224
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/content/aip/journal/jap/66/6/10.1063/1.344224
1989-09-15
2014-07-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The calibration of the strength of the localized vibrational modes of silicon impurities in epitaxial GaAs revealed by infrared absorption and Raman scattering
http://aip.metastore.ingenta.com/content/aip/journal/jap/66/6/10.1063/1.344224
10.1063/1.344224
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