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Thin‐oxide dual‐electron‐injector annealing studies using conductivity and electron energy‐loss spectroscopy
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10.1063/1.348713
/content/aip/journal/jap/69/4/10.1063/1.348713
http://aip.metastore.ingenta.com/content/aip/journal/jap/69/4/10.1063/1.348713
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/content/aip/journal/jap/69/4/10.1063/1.348713
1991-02-15
2014-08-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thin‐oxide dual‐electron‐injector annealing studies using conductivity and electron energy‐loss spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/69/4/10.1063/1.348713
10.1063/1.348713
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