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Determination of the interface charge between an epilayer and a substrate using capacitance‐voltage measurements
1.H. Kroemer, in VLSI Electronics: Microstructure Science (Academic, New York, 1985), Vol. 10, Chap. 4, p. 121.
2.D. P. Kennedy, P. C. Murley, and W. Kleinfelder, IBM J. Res. Develop. 12, 399 (1968).
3.H. Kroemer, W.-Y. Chien, J. S. Harris, J. R. Edwall, and D. D. Edwall, Appl. Phys. Lett. 36, 295 (1980).
4.S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981), Chap. 5.
5.R. F. Pierret: Semiconductor Fundamentals, Vol. 1 of Modular Series on Solid State Devices (Addison-Wesley, Reading, MA, 1983).
6.N. Amir, D. Goren, D. Fekete, and Y. Nemirovsky, J. Electron. Mater. 20, 227 (1990).
7.Y. Nemirovsky, D. Goren, and A. Ruzin, J. Electron. Mater. 20, 609 (1991).
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