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Evaluation of In1−x Ga x As/In1−y Ga y As strained layer superlattice structures by x‐ray diffraction measurements with a novel discrimination method of the fundamental peak
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10.1063/1.351286
/content/aip/journal/jap/71/3/10.1063/1.351286
http://aip.metastore.ingenta.com/content/aip/journal/jap/71/3/10.1063/1.351286
/content/aip/journal/jap/71/3/10.1063/1.351286
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/content/aip/journal/jap/71/3/10.1063/1.351286
1992-02-01
2015-01-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Evaluation of In1−xGaxAs/In1−yGayAs strained layer superlattice structures by x‐ray diffraction measurements with a novel discrimination method of the fundamental peak
http://aip.metastore.ingenta.com/content/aip/journal/jap/71/3/10.1063/1.351286
10.1063/1.351286
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