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Stress evolution due to electromigration in confined metal lines
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10.1063/1.354073
/content/aip/journal/jap/73/8/10.1063/1.354073
http://aip.metastore.ingenta.com/content/aip/journal/jap/73/8/10.1063/1.354073
/content/aip/journal/jap/73/8/10.1063/1.354073
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/content/aip/journal/jap/73/8/10.1063/1.354073
1993-04-15
2014-10-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Stress evolution due to electromigration in confined metal lines
http://aip.metastore.ingenta.com/content/aip/journal/jap/73/8/10.1063/1.354073
10.1063/1.354073
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