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Structures and properties of electron‐beam‐evaporated indium tin oxide films as studied by x‐ray photoelectron spectroscopy and work‐function measurements
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10.1063/1.352818
/content/aip/journal/jap/73/9/10.1063/1.352818
http://aip.metastore.ingenta.com/content/aip/journal/jap/73/9/10.1063/1.352818
/content/aip/journal/jap/73/9/10.1063/1.352818
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/content/aip/journal/jap/73/9/10.1063/1.352818
1993-05-01
2014-07-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structures and properties of electron‐beam‐evaporated indium tin oxide films as studied by x‐ray photoelectron spectroscopy and work‐function measurements
http://aip.metastore.ingenta.com/content/aip/journal/jap/73/9/10.1063/1.352818
10.1063/1.352818
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