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Characterization and depth profiling of E’ defects in buried SiO2
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10.1063/1.354103
/content/aip/journal/jap/74/1/10.1063/1.354103
http://aip.metastore.ingenta.com/content/aip/journal/jap/74/1/10.1063/1.354103
/content/aip/journal/jap/74/1/10.1063/1.354103
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/content/aip/journal/jap/74/1/10.1063/1.354103
1993-07-01
2014-10-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization and depth profiling of E’ defects in buried SiO2
http://aip.metastore.ingenta.com/content/aip/journal/jap/74/1/10.1063/1.354103
10.1063/1.354103
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