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Magnetoresistive characterization of thin‐film structures by a gradient‐field method (abstract)
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10.1063/1.355515
/content/aip/journal/jap/75/10/10.1063/1.355515
http://aip.metastore.ingenta.com/content/aip/journal/jap/75/10/10.1063/1.355515
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/content/aip/journal/jap/75/10/10.1063/1.355515
1994-05-15
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Magnetoresistive characterization of thin‐film structures by a gradient‐field method (abstract)
http://aip.metastore.ingenta.com/content/aip/journal/jap/75/10/10.1063/1.355515
10.1063/1.355515
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