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Analyses of localized confinement potential in semiconductor strained wires and dots buried in lattice‐mismatched materials
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10.1063/1.357970
/content/aip/journal/jap/76/11/10.1063/1.357970
http://aip.metastore.ingenta.com/content/aip/journal/jap/76/11/10.1063/1.357970
/content/aip/journal/jap/76/11/10.1063/1.357970
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/content/aip/journal/jap/76/11/10.1063/1.357970
1994-12-01
2014-09-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analyses of localized confinement potential in semiconductor strained wires and dots buried in lattice‐mismatched materials
http://aip.metastore.ingenta.com/content/aip/journal/jap/76/11/10.1063/1.357970
10.1063/1.357970
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