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Raman scattering study of [hhk]‐GaAs/(Si or CaF2) strained heterostructures
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10.1063/1.357542
/content/aip/journal/jap/76/5/10.1063/1.357542
http://aip.metastore.ingenta.com/content/aip/journal/jap/76/5/10.1063/1.357542
/content/aip/journal/jap/76/5/10.1063/1.357542
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/content/aip/journal/jap/76/5/10.1063/1.357542
1994-09-01
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Raman scattering study of [hhk]‐GaAs/(Si or CaF2) strained heterostructures
http://aip.metastore.ingenta.com/content/aip/journal/jap/76/5/10.1063/1.357542
10.1063/1.357542
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